GE Inspection Phasor XS 16:64 Phased Array Flaw Detector

GE Inspection Phasor XS 16:64 Phased Array Flaw Detector The GE Phasor XS brings the proven advantages of Phased Array technology to a new – and accessible – level. This portable and rugged device combines the value of Phased Array with a codecompliant conventional UT flaw detector. It is simple to use, easy to learn and specially designed with practical, relevant features. GE Inspection Phasor XS 16:64 Phased Array Flaw Detector The GE Phasor XS brings the proven advantages of Phased Array technology to a new – and accessible – level. This portable and rugged device combines the value of Phased Array with a codecompliant conventional UT flaw detector. It is simple to use, easy to learn and specially designed with practical, relevant features. When used in Phased Array mode, the operator can electronically control multiple beams from one probe. The precise beam control including angle, focus and size, results in improved probability of detection (POD) and sizing. With one scan from one contact location, greater area is covered and comprehensive data can be viewed in real time on a full color sector display. When compared to conventional Ultrasonic inspection, the productivity and cost savings from the Phasor XS are easily measured. Productivity gains When the inspection requires a different angle with conventional ultrasonic testing, the operator must change his probe and re-visualize the integration of the new information. A different time base and sensitivity level is represented. Although this is not a problem for the skilled operator, it takes time. Through the power of Phasor XS, these inefficiencies are drastically minimized. Real time color imaging from the Phasor XS supplies an integrated cross-sectional visualization of the part originating from multiple angles. A single A-Scan can also be selected for display in combination with the image. With a single probe, you can achieve more than ever before – and in less time! GE Inspection Phasor XS 16:64 Phased Array Flaw Detector Overall, the Phasor XS provides: Improved area coverage, faster results More information from one scan of the part Better recorded result from the generation of an image One probe replicates the capabilities of many conventional UT probes and wedges Time and cost savings from reduced hours evaluating indications with multiple angles   Measurable time savings! Some weld inspections require a complete scan with three separate angles. Using the Phasor XS can result in a time savings of two thirds!   Test quality improvements Defect orientation is a prediction made in the development of a test procedure and an inspection angle is chosen based on this prediction. Beam spread is chosen purposely broad to account for some level of error in the prediction, so essentially it is a compromise. With the Phasor XS, electronic control of the beam allows test procedures to be developed that will yield higher Probability of Detection (POD), in the same inspection time, by allowing the choice of an ideal beam over the full inspection area. The quality of the scan is improved and the Phasor XS’ full-color, real time sector display with selectable A-Scan supplies the standard accepted method for instant and reliable sizing.   Simple change over Building Phased Array capabilities into a successful proven operating platform ensures the transition to Phased Array inspection will be cost effective. Phasor XS’ simple menu driven operation of basic Phased Array controls puts the technology within reach of the Level II field inspector. Data is easily interpreted and the cost of training is minimal.   Standard Features An on board data set memory is combined with removable storage via an SD card for documentation and setup storage. This ensures your operators will be working with consistent setups to get brilliant results that you can see later on the screen or computer The unique Sector Freeze mode allows review and storage of all the A-Scans behind the image. Select your beam of interest from all of the shots for separate display and improve your sizing with focal and angle control. Combined Phased Array and code compliant Conventional UT flaw detector Truly portable Phased Array – less than 4 kg (7 lbs) Electronically controlled and selectable beam angles, focus and size Simultaneous inspection with multiple beams from a single location Full color, real time sector display with a selectable ASCAN Fullscreen Bscan plus Display reverse and flip Rugged packaging to withstand heavy onsite use Snap shot image storage of sector images and ASCANS Dialog probes 16/64 Delay law calculator Push button control for operation in a bag Simple operating scheme Image transfer via SD card GE Inspection Phasor XS 16:64 Phased Array Flaw Detector Specifications: Display Size Resolution 6.5” VGA (640*480 pixel) color TFT, 60Hz refresh rate Battery Type Custom Li-Ion battery pack (3S6P configuration) Battery Life 4 hours minimum Battery Charging External charger that connects directly to the battery pack External Power Supply Universal input (85 – 265V / 50 – 60 Hz) Units of Measure inch and mm SD Card Memory Sealed compartment Number of Cycles Focal Laws Conventional Channel: 1 Phased Array Channels: 128 (max) Pulse repetition frequency Conventional Channel: 15 to 2000Hz Phased Array Channels: 15 to 7680Hz Pulser Type Conventional Channel: Spike Phased Array Channels: Bipolar Squarewave Pulser Voltage Conventional Channel: 300V (max) Phased Array Channels: /-25V to /-75V Pulser Energy Conventional Channel: Low, High Phased Array Channels: n/a Pulser Rise Time Conventional Channel: <15ns Phased Array Channels: Not Specified Damping Conventional Channel: 50, 500 and 1000 Phased Array Channels: n/a Dual Mode Conventional Channel: Off and On Phased Array Channels: n/a Receiver input Capacitance Conventional Channel: <50pF Phased Array Channels: Maximum input voltage Conventional Channel: 40Vp-p Phased Array Channels: Bandwidth / Amplifier bandpass Conventional Channel: 0.3 to 15MHz(-3dB points) Phased Array Channels: 0.5 to 10MHz Direct Documentation Format Conventional Channel: JPEG Phased Array Channels: JPEG Probe Connections Conventional Channel: 00 Lemo/ BNC Adaptor Supplied Phased Array Channels: Custom Supplied Physical Probe Conventional Channel: n/a Phased Array Channels: 1 to 64 Virtual probe Conventional Channel: n/a Phased Array Channels: 1 to 16 Number of Cycles Conventional Channel: 1 Phased Array Channels: 1 to 128 Pulser Width (1/2 Cycle) Conventional Channel: n/a Phased Array Channels: 40 to 500ns Pulser Delay Conventional Channel: n/a Phased Array Channels: 0 to 10.24us Receiver Delay Conventional Channel: n/a Phased Array Channels: 0 to 10.24us Receiver Input Resistance Conventional Channel: 1000ohm (dual mode) Phased Array Channels: 220ohm Analog Gain Conventional Channel: 0 to 110.0dB Phased Array Channels: 0 to 40.0dB Digital Gain Conventional Channel: n/a Phased Array Channels: 0 to 50.0dB Frequency Select Conventional Channel: 2.25MHz, 5MHz, LP and HP Phased Array Channels: 2.25MHz, 5MHz, LP and HP Rectification Conventional Channel: PosHW, NegHW and Fullwave Phased Array Channels: PosHW, NegHW and Fullwave Measurement Resolution Conventional Channel: 5nsec Phased Array Channels: 5nsec Displayed Readings Conventional Channel: A%A, A%B, SA/, SA^, SB/, SB^ Phased Array Channels: A%A, A%B, SA/, SA^, SB/, SB^ VGA output Conventional Channel: Yes Phased Array Channels: Yes SD Card Memory Conventional Channel: Yes Phased Array Channels: Yes RS 232 interface Conventional Channel: Yes Phased Array Channels: Yes Auto Timebase Calibration Conventional Channel: Yes Phased Array Channels: No Reject Conventional Channel: 0 to 80% Phased Array Channels: 0 to 80% TCG Conventional Channel: 16 points (max) – 6dB/usec Phased Array Channels: 16 points (max) – 6dB/usec Sound Velocity Conventional Channel: .0393 – .5905”/us[1000 – 15000m/s] Phased Array Channels: .0393 – .5905”/us[1000 – 15000m/s] Range Conventional Channel: 5m @ steel shear velocity Phased Array Channels: 1m @ steel shear velocity Weight Conventional Channel: 7.5lbs (with batteries) Phased Array Channels: 7.5lbs (with batteries) Size Conventional Channel: 11.1”W x 6.75”H x 6.25”D (282 x 171 x 159mm) Phased Array Channels: 11.1”W x 6.75”H x 6.25”D (282 x 171 x 159mm) Display Delay Conventional Channel: 2.5m @ steel shear velocity Phased Array Channels: 1m @ steel shear velocity Gates Conventional Channel: A, B Phased Array Channels: A,B,IF Gate Threshold Conventional Channel: 5% to 95% Phased Array Channels: 5% to 95% Gate Start Conventional Channel: [0.1mm to 2m] Phased Array Channels: 0.1mm to 1m Gate Width Conventional Channel: [0.1mm to 2m] Phased Array Channels: 0.1mm to 1m Gate Modes Conventional Channel: Off, Pos, Neg[Off, Coincidence, Anticoincidence] Phased Array Channels: TOF Modes Conventional Channel: Flank, Peak Phased Array Channels: Flank, Peak Scan type Conventional Channel: n/a Phased Array Channels: Linear or Sector Data visualization refresh rate Conventional Channel: 60Hz Phased Array Channels: 60Hz Available views Conventional Channel: Ascan Phased Array Channels: Ascan only, Image only, Ascan Image Dialog Languages Conventional Channel: English, Spanish, German, French, Chinese, Japanese Phased Array Channels: English, Spanish, German, French, Chinese, Japanese Environmental tests Cold Storage -20C for 72 hrs, 502.4 Procedure I Cold Operation 0C for 16 hrs, 502.4 Procedure II Heat Storage 70C for 48 hrs, 501.4 Procedure I Heat Operation 55C for 16 hrs, 501.4 Procedure II Damp Heat / Humidity 10 Cycles: 10hrs at 65C down to 30C, 10 hrs at 30C up to 65C, Transition within 2 hrs, 507.4 Temperature Shock 3 Cycles: 4 hrs at –20C up to 70C, 4 hrs at 70C, Transitions within 5 minutes, 503.4 Procedure II Vibration 514.5-5 Procedure I, Annex C, Figure 6, General exposure: 1hr each axis Shock 6 cycles each axis, 15g, 11ms half sine, 516.5 Procedure I Loose Cargo 514.5 Procedure II Transit Drop 516.5 Procedure IV, 26 drops IP54 / IEC529 Dust Proof / Dripping water proof as per IEC 529 Environmental sealing tests IP54 / IEC529 … Dust Proof / dripping water proof as per IEC 529 specifications for IP54 classification Enviromental op temp Low battery indication Amplitude variation expected over battery life Graticule Architectural suppression Linearity on timebase Pulser, Voltage p to p, rise time, duration, fall time, Reverberation ampitude, frequncy spectrum plot Amplifier and attenuator Show More Show Less